Resolving Multilayer Structure of Pressure Sensitive Adhesive by Atomic Force Microscopy (AFM)
نویسندگان
چکیده
منابع مشابه
Atomic Force Microscopy (AFM)Topographical Surface Characterization of Multilayer-Coated and Uncoated Carbide Inserts
In recent years, scanning probe atomic force microscopy SPM AFM has gained acceptance over a wide spectrum of research and science applications. Most fields focuses on physical, chemical, biological while less attention is devoted to manufacturing and machining aspects. The purpose of the current study is to assess the possible implementation of the SPM AFM features and its NanoScope software i...
متن کاملResolving Single Kinesin Motors in Motion by Atomic Force Microscopy
Carolina Carrasco, Iwan A. T. Schaap, Pedro J. de Pablo, Christoph f. Schmidt 1 Departamento de Física de la Materia Condensada C-III, Universidad Autónoma de Madrid, 28049 Madrid, Spain 2 National Institute for Medical Research, The Ridgeway, Mill Hill, London, NW7 1AA, United Kingdom 3 Physikalisches Institut, Fakultät für Physik, Georg-August-Universität, Friedrich-Hund-Platz 1, 37077 Göttin...
متن کاملProbing particle structure in waterborne pressure-sensitive adhesives with atomic force microscopy.
There is a need to know the nanostructure of pressure-sensitive adhesive (PSA) films obtained from waterborne polymer colloids so that it can be correlated with properties. Intermittent-contact atomic force microscopy (AFM) of an acrylic waterborne PSA film identifies two components, which can be attributed to the polymer and the solids in the serum (mainly surfactant). It is found that when th...
متن کاملApplication of Atomic Force Microscopy (AFM) in Polymer Materials
Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer...
متن کاملIn-Process Atomic-Force Microscopy (AFM) Based Inspection
A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to compensate for any deviation such as instantaneous degradation of the lithography probe tip. Traditional method used the AFM probes for lithography work and retract to inspect the obtained feature but this practice degrades the probe tip shape and hence, affects the measurement quality. This pape...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618005871